Asian Journal of Physics Vol. 33, Nos 1 & 2 (2024) 47-60

Thermal properties of 2D materials in the monolayer limit: Raman scattering techniques

Clara Trillo Yagüe and Andrés Cantarero
Molecular Science Institute, University of Valencia, PO Box 22085 Valencia, Spain

Raman spectroscopy has become the most suitable method to measure the thermal conductivity of two dimensional (2D) semiconductors (also named layered or van der Waals materials) in a few layer samples or in the monolayer (ML) limit. Raman spectroscopy is an optical technique, therefore avoids the use of contacts, which can complicate the modelization of the experiment, masking the real values of the thermal conductivity of the 2D material. The technique employs a laser as the heating element and the Raman signal as a thermometer. In its simple set up we need a laser, which can be focused on the flake of the material with a high magnifcation objective and a single monochromator with an edge filter can be used to monitor the temperature. The in-plane thermal conductivity is obtained by appropriately modeling the experiment. Care has to be taken in designing the experiment to simplify the theoretical model and control all possible sources of errors and uncertainties. In this work, we discuss the fundamental principles of the method, the details of the theoretical modeling, the approximations made in the model and the main uncertainties giving rise to over- or under estimations of the thermal conductivity. We also advise from wrong interpretations found in the literature. Finally, a list of thermal conductivity values of 2D materials is given and discussed. © Anita Publications. All rights reserved.
Keywords: Raman scattering, Thermal conductivity, 2D materials. Graphene.

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Method: Single- anonymous; Screened for Plagiarism? Yes
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