ASIAN JOURNAL OF PHYSICS

An International Peer Reviewed Research Journal
Frequency : Monthly,
ISSN : 0971 – 3093
Editor-In-Chief (Hon.) :
Dr. V.K. Rastogi
e-mail:[email protected]
[email protected]

 AJP ISSN : 0971 – 3093
Vol 35, Nos 11 – 12, November- December, 2026

Asian
Journal of Physics

An International Peer Reviewed Research Journal
Advisory Editors : W Kiefer, FTS Yu & Maria J Yzuel
Editor-in-Chief : V K Rastogi
Co-Editor-in-Chief: Maria L Calvo

Volume 35 Nos 11 – 12 November- December, 2026

Special issue in honour
of
Prof Dr Wolfgang Osten
Guest Editors
Rajpal S Sirohi

Anita Publications
FF-43, 1st Floor, Mangal Bazar, Laxmi Nagar, Delhi-110 092, India


Paper in Press

Optical wafer metrology in lithography
A J den Boef

Solving quadrature regularized phase tracking through fixed-point iteration
Ricardo Legarda-Saenz, Carlos Brito-Loeza, and Naomi Martinez-Ku

Holographic interferometry to multimodal photonic diagnostics in cultural heritage from a recent view through my collaboration with Wolfgang Osten in EC projects
Vivi Tornari

A Fast and Robust Multi-Line Laser Center Extraction Algorithm Based on Adaptive Jump Search Strategy
Zhihao Huang, Yifan Liao, Qijian Tang, Xiaoli Liu, Xiang Peng and Wenqi He

Post-Recording Axial Resolution Engineering in Incoherent Computational Imaging: A Review
S Gopinath and V Anand

Camera-based multipoint measurement techniques: a review
Tobias Haist

A 3D multispectral multimodal imaging framework for contactless vital-sign measurement
Wang Liao, Chen Zhang and Gunther Notni

Statistical properties of the Stokes parameters in thermal light: A review
Wei Wang and Mitsuo Takeda

Analysis and applications of three-dimensional Fourier-transform-based diffraction calculation
Yusuke Sando, Daisuke Barada and Toyohiko Yatagai

Linear path delay as height reference for fourier transform speckle profilometry using wavelength-tunable laser source
P Harikrishnan and Dinesh N Naik

Analysis and applications of three-dimensional Fourier-transform-based diffraction calculation
Yusuke Sando, Daisuke Barada and Toyohiko Yatagai

Automated, low-cost and simple polarimeter based on intensity measurements by an LDR
U Rivera-Ortega, J Dirckx and S Van Der Jeught