Asian Journal of Physics Vol. 30 Nos 10 & 11 (2021) 1513-1520

Graphics processing unit assisted space-frequency method for high-speed defect propagation analysis from fringe patterns
Ankur Vishnoi and Gannavarpu Rajshekhar


In non-invasive optical metrology, high-speed defect propagation analysis from the fringe pattern is of great interest. The paper proposes a graphics processing unit (GPU) assisted space-frequency method for rapid fringe processing to trace the defect propagation in the fringe patterns. In order to illustrate the proposed method for defect propagation, we have simulated hundred frames of fringe pattern mimicking dynamically evolving crack patterns in a test object. Furthermore, the simulated fringe patterns having sizes of 2048 by 2048 pixels are corrupted with additive white Gaussian noise (AWGN) such that the signal-to-noise ratio (SNR) is 0 dB. These noisy fringe patterns are expeditiously processed using the proposed method by utilizing the parallel processing capability of GPU device in conjunction with a robust two-dimensional space-frequency method. The significant improvement in the execution time by parallel processing of GPU device as compared to sequential processing using Python’s NumPy scientific library has been demonstrated and validated using the simulation and experimental results. © Anita Publications. All rights reserved.
Keywords: Optical metrology, Non-destructive testing

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Method: Single- anonymous; Screened for Plagiarism? Yes
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