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Asian Journal of Physics Vol. 33, Nos 1 & 2 (2024) 39-45

Near-field scanning optical microscopic studies for surface plasmon polariton in heavily doped nitride nanostructures

Kishore K Madapu1 and Sandip Dhara1,2
1Surface and Sensors Studies Division, Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam-603 102, India
2A CI of Homi Bhabha National Institute, Mumbai- 400 094, India

Near-field scanning optical microscopy (NSOM) plays a key role in achieving optical resolution beyond the so-called diffraction limit and studying the properties of the plasmonic materials. The present report reviews the principle of near-field scanning optical microscopy and its different modes of operation. In addition, NSOM is extensively utilized to study the plasmonic properties of metals, graphene, and heavily doped semiconductors. The applications of NSOM in plasmonic materials is also reviewed. The advantage of NSOM in generating surface plasmon polaritons is especially emphasized. © Anita Publications. All rights reserved. doi:10.54955/AJP.33.1-2.2024.39-45.
Keywords: Diffraction limit, Evanescent wave, NSOM, Surface Plasmons, SPP.

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Method: Single- anonymous; Screened for Plagiarism? Yes
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