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Asian Journal of Physics Vol 32, Nos 1 & 2 (2023) 101-126

Resonant Raman scattering in semiconductor nanostructures and thin films

Andrés Cantarero and Carlos Rodríguez-Fernández
Molecular Science Institute, University of Valencia, PO Box 22085, 46071 Valencia, Spain

Raman spectroscopy is a versatile technique which provides valuable information of many physical properties of solid: crystals and nanostructures from its characteristic phonon spectrum. Magnetic phase transitions are observed through the change of the phonon spectrum or the behaviour of particular phonon modes, surface states or interfaces can be studied through the appearance of new phonon modes, the electronic structure of solids can be analysed by means of resonant Raman scattering, the stress can be obtained by analysing the shift of non-polar phonons and the knowledge of the phonon deformation potentials. These are a few examples of the power of this standout technique. Micro-Raman spectroscopy allows the successful analysis of tiny amounts of samples, single quantum dots, quantum wires or two-dimensional materials. In this paper, after a brief theoretical introduction, we will give some examples of the use of resonant Raman scattering in the study of semiconductor nanostructures and thin films. © Anita Publications. All rights reserved.
Keywords: Raman spectroscopy, Electron-phonon interaction, Semiconductor nanostructures.

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