Editor-in-Chief : V.K. Rastogi
Simultaneous measurement of thickness and refractive index by Fresnel biprism interferometry and Fourier transform
Asian Journal of Physics Vol. 34, Nos 7 & 8 (2025) 467-472 Simultaneous measurement of thickness and refractive index by Fresnel biprism interferometry and Fourier transform Parnia Farsijani1, Marzieh Amani1, M Taghi Tavassoly2 and Masoomeh Dashtdar1 1Department of Physics, Shahid…
