Asian Journal of Physics Vol 31, No 8 (2022) 817-822

Linear retardance model for a rotating polarizer-analyzer polarimeter

Geliztle A Parra-Escamilla1,2, Francisco Joel Cervantes-Lozano1 and David I Serrano-García1
1Electro-Photonics Engineering Department, University Center of Exact Sciences and Engineering (CUCEI), University of Guadalajara, Av. Revolución No. 1500, CP. 44430 Guadalajara, Jalisco, México., México.
2Faculty of Engineering, Universidad Panamericana. Álvaro del Portillo 49, Zapopan, Jalisco, 45010, Mexico

This article is dedicated to Professor Cesar Sciammarella


We present a demodulation approach for a rotating polarizer-analyzer polarimeter dedicated to linear retardance measurements. Our rotating polarizer-analyzer polarimeter analysis is based on retrieving a transparent sample’s partial Mueller matrix measurement to be later associated with its phase retardation properties. We present experimental results showing the feasibility of our proposal. © Anita Publications. All rights reserved.
Keywords: Polarized Light, Mueller Matrix, Optics Instrumentation, Linear Retarder.
DOI: https://doi.org/10.54955/AJP.31.8.2022.817-822


Peer Review Information
Method: Single- anonymous; Screened for Plagiarism? Yes
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References

  1. Yan L, Li Y, Chen W, Lin Y, Zhang F, Wu T, Peltoniemi J, Zhao H, Liu S, Zhang Z, Temporal and Spatial Characteristics of the Global Skylight Polarization Vector Field, Remote Sens, 14(2022)2193; doi.org/10.3390/rs14092193.
  2. Harten G V, Boer J D, Rietjens J H H, Noia A D, Snik F, Volten H, Smit J M, Hasekamp O P, Henzing J S, Keller C U, Atmospheric aerosol  characterization  with  a  ground-based  SPEX  spectropolarimetric  instrument,  Atmos Meas Tech, 7(2014)4341–4351.
  3. Li D, Zeng N, Zhan D, Chen Y, Zeng M, Ma H, Differentiation of soot particulates in air using polarized light scattering method, Appl Opt, 56(2017)4123–4129.
  4. Calvert G, Lesniak J, Honlet M, Applications of modern automated photoelasticity to industrial problems, Insight, 44(2002)224–227.
  5. Novikova T, Pierangelo A, Martino A D, Benali A, Validire P, Polarimetric imaging for cancer diagnosis and staging, Opt Photonics News, 23(2012)26–33.
  6. Azzam R M A, Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal, Opt Lett, 2(1978)148–150.
  7. He C, He H, Chang J, Chen B, Ma H, Booth M J, Polarisation optics for biomedical and clinical applications: a review, Light: Sci Appl, 10(2021)194; doi.org/10.1038/s41377-021-00639.
  8. Arteaga O, Freudenthal J, Wang B, Kahr B, Mueller matrix polarimetry with four photoelastic modulators: theory and calibration, Appl Opt, 51(2012)6805–6817.
  9. Caurel E G, Martino A D, Drevillon B, Spectroscopic Mueller polarimeter based on liquid crystal devices, Thin Solid Films, 455(2004)120–123.
  10. Boulesteix B L, Martino A D, Drévillon B, Schwartz L, Mueller polarimetric imaging system with liquid crystals, Appl Opt, 43(2004)2824–2832.
  11. Ghosh N, Vitkin A I, Tissue polarimetry: concepts, challenges, applications, and outlook, J Biomed Opt, 16(2011): 110801; doi.org/10.1117/1.3652896.
  12. Goldstein D, Polarized Light, (CRC Press), 2017.
  13. Chipman R A, Lam W T, Young G, Polarized Light and Optical Systems, (CRC Press), 2019.
  14. Sanaâ F, Makhlouka Y, Gharbia M, Linear retardance and diattenuation dispersion measurements of anisotropic medium with Jones calculus based spectrometric technique, Results in Physics, 37(2022): 105522;org/10.1016/j.rinp.2022.105522.
  15. Gilliot M, Naciri A E, Theory of dual-rotating polarizer and analyzer ellipsometer, Thin Solid Films, 540 (2013)46–52.
  16. El-Agez T M, Taya S, Development and construction of rotating polarizer analyzer ellipsometer, Opt Lasers Eng, 49(2011)507–513.
  17. Taya S, El-Agez T M, Effect of noise on the optical parameters extracted from different ellipsometric configurations, Phys Scr, 85(2012)45706; doi. 10.1088/0031-8949/85/04/045706.
  18. Xia G Q, Zhang R J, Chen Y L, Zhao H B, Wang S Y, Zhou S M, Zheng Y X, Yang Y M, Chen L Y, New design of the variable angle infrared spectroscopic ellipsometer using double Fourier transforms, Rev Sci Instrum, 71(2000)2677; doi.org/10.1063/1.1150674.
  19. Berezhna S Y, Berezhnyy I V, Takashi M, Dynamic photometric imaging polarizer-sample-analyzer polarimeter: instrument for mapping birefringence and optical rotation, J Opt Soc Am A, 18(2001)666–672.
  20. Berezhna S Y, Berezhnyy I V, Takashi M, Integrated photoelasticity through imaging Fourier polarimetry of an elliptic retarder, Appl Opt, 40(2001)644–651.
  21. Yu C J, Fully variable elliptical phase retarder composed of two linear phase retarders, Rev Sci Instrum, 87(2016) 035106; doi.org/10.1063/1.4943223.
  22. Slepkov A D, Quantitative measurement of birefringence in transparent films across the visible spectrum, Am J Phys, 90(2022)625; doi.org/10.1119/5.0087798.