Editor-in-Chief : V.K. Rastogi
High accuracy surface roughness measurements utilizing evanescent illumination
Asian Journal of Physics Vol. 30 Nos 10 & 11 (2021) 1573-1591 High accuracy surface roughness measurements utilizing evanescent illuminationF M Sciammarella, C A Sciammarella and L Lamberti Abstract This paper describes a novel optical methodology to characterize surface roughness…